Krishnakumar SB, Podgorsak AR, Nagesh SS, Jain A, Rudin S, Bednarek DR, Ionita CN. Investigation of Noise and Contrast Sensitivity of an Electron Multiplying Charge-Coupled Device (EMCCD) based Cone Beam Micro-CT System. Proc SPIE Int Soc Opt Eng. 2016 Feb 27; 9783.